Element Symbol:LaAlO3
CAS:12057-25-5
Model:Sup-LaAlO3
Shape:Wafer, Disc or ingot
Thickness:[N/A]
Dimension:[N/A]
(Note: Purity, shape, thickness, and dimensions can all be customized)
Lanthanum aluminate (LaAlO₃) single crystals are important industrial materials for large-sized high-temperature superconducting film substrates. They can be grown using the floating zone method, yielding single crystals and substrates with diameters of 2 inches or larger. LaAlO₃ exhibits good lattice matching with high-temperature superconductors such as YBa₂Cu₃O₇, has a low dielectric constant, and low microwave loss, making it suitable for the fabrication of high-temperature superconducting microwave electronic devices (such as high-temperature superconducting microwave filters used in long-distance communication). This material has significant practical and potential application prospects.
Note: Purity, shape, thickness, and dimensions can all be customized,Please feel free to contact us for more details.
Main Properties:
- Thermal Stability: LaAlO₃ exhibits good thermal stability, maintaining its structure and performance in high-temperature environments.
- Electrical Insulation: This material demonstrates outstanding electrical insulation properties, making it ideal for high-frequency and high-temperature applications.
Applications:
1. Substrate Material: LaAlO₃ is commonly used as a substrate for high-temperature superconductors and other oxide semiconductors, facilitating the growth of high-quality thin films.
2. Optoelectronic Devices: It serves as an excellent substrate material in lasers and photodetectors.
3. Catalyst Support: LaAlO₃ can act as a catalyst support in various catalytic reactions, enhancing reaction efficiency.
Main performance parameters | ||
Crystal structure | M6(normal temperature) | M3(>435℃) |
Lattice constant | M6 a=5.357A c=13.22 A | M3 a=3.821 A |
Melting point(℃) | 2080 | |
Density | 6.52(g/cm3) | |
Hardness | 6-6.5(mohs) | |
Thermal expansion coefficient | 9.4x10-6/℃ | |
Dielectric constants | ε=21 | |
Secant loss(10ghz) | ~3×10-4@300k,~0.6×10-4@77k | |
Color and appearance | To anneal and conditions differ from brown to brownish | |
Chemical stability | Room temperature is not dissoluble in minerals, the temperature is greater than 150 ℃ in soluble h3po4 | |
Characteristics | For microwave electron device | |
Growth method | Czochralski method | |
Size | 10x3,10x5,10x10,15x15,,20x15,20x20, | |
Ф15,Ф20,Ф1″,Ф2″,Ф2.6″ | ||
Thickness | 0.5mm,1.0mm | |
Polishing | Single-sided or double-sided | |
Crystal orientation | <100> <110> <111> | |
Crystal plane orientation accuracy | ±0.5° | |
Edge orientation accuracy | 2°(Special requirements can reach within 1°) | |
Bevel wafer | According to specific requirements, wafers with edge-oriented crystal planes inclined at a specific angle (inclination angle 1°-45°) can be processed | |
Ra: | ≤5Å(5µm×5µm) | |
Package | Class 100 clean bag, Class 1000 super clean room |
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